GaN Transistors' Radiated Switching Noise Source Evidenced by Hall Sensor Experiments Toward Integration

Vlad Marsic, Soroush Faramehr, Joe Fleming, Rohit Bhagat, Petar Igic. GaN Transistors' Radiated Switching Noise Source Evidenced by Hall Sensor Experiments Toward Integration. IEEE Access, 12:13783-13794, 2024. [doi]

Abstract

Abstract is missing.