Measuring sample distortions in face recognition - researchr publication authors

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Maria De Marsico, Michele Nappi, Daniel Riccio. Measuring sample distortions in face recognition. In Sebastiano Battiato, Sabu Emmanuel, Adrian Ulges, Marcel Worring, editors, Proceedings of the 2nd ACM workshop on Multimedia in forensics, security and intelligence, MiFor@MM 2010, Firenze, Italy, October 29, 2010. pages 83-88, ACM, 2010. [doi]

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