Maria De Marsico, Michele Nappi, Daniel Riccio. Measuring sample distortions in face recognition. In Sebastiano Battiato, Sabu Emmanuel, Adrian Ulges, Marcel Worring, editors, Proceedings of the 2nd ACM workshop on Multimedia in forensics, security and intelligence, MiFor@MM 2010, Firenze, Italy, October 29, 2010. pages 83-88, ACM, 2010. [doi]
@inproceedings{MarsicoNR10-2,
title = {Measuring sample distortions in face recognition},
author = {Maria De Marsico and Michele Nappi and Daniel Riccio},
year = {2010},
doi = {10.1145/1877972.1877994},
url = {http://doi.acm.org/10.1145/1877972.1877994},
researchr = {https://researchr.org/publication/MarsicoNR10-2},
cites = {0},
citedby = {0},
pages = {83-88},
booktitle = {Proceedings of the 2nd ACM workshop on Multimedia in forensics, security and intelligence, MiFor@MM 2010, Firenze, Italy, October 29, 2010},
editor = {Sebastiano Battiato and Sabu Emmanuel and Adrian Ulges and Marcel Worring},
publisher = {ACM},
isbn = {978-1-4503-0157-2},
}