S. Martirosyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian. An efficient testing methodology for embedded flash memories. In 2017 IEEE East-West Design & Test Symposium, EWDTS 2017, Novi Sad, Serbia, September 29 - October 2, 2017. pages 1-4, IEEE Computer Society, 2017. [doi]
Abstract is missing.