Daisuke Maruyama, Akira Kanuma, Takashi Mochiyama, Hiroaki Komatsu, Yaroku Sugiyama, Noriyuki Ito. Detection of multiple transitions in delay fault test of SPARC64 microprocessor. In 2004 International Conference on Computer-Aided Design (ICCAD 04), November 7-11, 2004, San Jose, CA, USA. pages 893-898, IEEE Computer Society / ACM, 2004. [doi]
Abstract is missing.