Nyasha Masamba, Kerstin Eder, Tim Blackmore. Supervised Learning for Coverage-Directed Test Selection in Simulation-Based Verification. In IEEE International Conference On Artificial Intelligence Testing, AITest 2022, Newark, CA, USA, August 15-18, 2022. pages 19-25, IEEE, 2022. [doi]
@inproceedings{MasambaEB22,
title = {Supervised Learning for Coverage-Directed Test Selection in Simulation-Based Verification},
author = {Nyasha Masamba and Kerstin Eder and Tim Blackmore},
year = {2022},
doi = {10.1109/AITest55621.2022.00012},
url = {https://doi.org/10.1109/AITest55621.2022.00012},
researchr = {https://researchr.org/publication/MasambaEB22},
cites = {0},
citedby = {0},
pages = {19-25},
booktitle = {IEEE International Conference On Artificial Intelligence Testing, AITest 2022, Newark, CA, USA, August 15-18, 2022},
publisher = {IEEE},
isbn = {978-1-6654-8737-5},
}