Supervised Learning for Coverage-Directed Test Selection in Simulation-Based Verification

Nyasha Masamba, Kerstin Eder, Tim Blackmore. Supervised Learning for Coverage-Directed Test Selection in Simulation-Based Verification. In IEEE International Conference On Artificial Intelligence Testing, AITest 2022, Newark, CA, USA, August 15-18, 2022. pages 19-25, IEEE, 2022. [doi]

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