Performance analysis and stability testing of a new structure of optoelectronic integrated device

Mohamed B. El Mashade, M. Ashry, Sh. M. Eladl, M. S. Rageh. Performance analysis and stability testing of a new structure of optoelectronic integrated device. Microelectronics Journal, 35(7):585-589, 2004. [doi]

@article{MashadeAER04,
  title = {Performance analysis and stability testing of a new structure of optoelectronic integrated device},
  author = {Mohamed B. El Mashade and M. Ashry and Sh. M. Eladl and M. S. Rageh},
  year = {2004},
  doi = {10.1016/j.mejo.2004.03.001},
  url = {http://dx.doi.org/10.1016/j.mejo.2004.03.001},
  tags = {testing, analysis},
  researchr = {https://researchr.org/publication/MashadeAER04},
  cites = {0},
  citedby = {0},
  journal = {Microelectronics Journal},
  volume = {35},
  number = {7},
  pages = {585-589},
}