Francisco Massa, Bryan C. Russell, Mathieu Aubry. Deep Exemplar 2D-3D Detection by Adapting from Real to Rendered Views. In 2016 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2016, Las Vegas, NV, USA, June 27-30, 2016. pages 6024-6033, IEEE Computer Society, 2016. [doi]
@inproceedings{MassaRA16,
title = {Deep Exemplar 2D-3D Detection by Adapting from Real to Rendered Views},
author = {Francisco Massa and Bryan C. Russell and Mathieu Aubry},
year = {2016},
doi = {10.1109/CVPR.2016.648},
url = {http://doi.ieeecomputersociety.org/10.1109/CVPR.2016.648},
researchr = {https://researchr.org/publication/MassaRA16},
cites = {0},
citedby = {0},
pages = {6024-6033},
booktitle = {2016 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2016, Las Vegas, NV, USA, June 27-30, 2016},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-8851-1},
}