Alessandro Massaro, Ivano Manfredonia, Angelo Galiano, Benny Xhahysa. Advanced Process Defect Monitoring Model and Prediction Improvement by Artificial Neural Network in Kitchen Manufacturing Industry: a Case of Study. In 2nd Workshop on Metrology for Industry 4.0 and IoT MetroInd4.0&IoT 2019, Naples, Italy, June 4-6, 2019. pages 64-67, IEEE, 2019. [doi]
Abstract is missing.