Alessandro Massaro, Antonio Panarese, Giovanni Dipierro, Emanuele Cannella, Angelo Galiano, Valeria Vitti. Image Processing Segmentation applied on Defect Estimation in Production Processes. In 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT, Roma, Italy, June 3-5, 2020. pages 565-569, IEEE, 2020. [doi]
Abstract is missing.