Bertolini Massimo, Rizzi Antonio, Romagnoli Giovanni, Volpi Andrea. Testing an RFID receiving gate for improving process accuracy in fashion and apparel retail. In IEEE 3rd International Forum on Research and Technologies for Society and Industry, RTSI 2017, Modena, Italy, September 11-13, 2017. pages 1-5, IEEE, 2017. [doi]
Abstract is missing.