Toshimitsu Masuzawa, Minoru Izutsu, Hiroki Wada, Hideo Fujiwara. Single-control testability of RTL data paths for BIST. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 210-215, IEEE Computer Society, 2000. [doi]
Abstract is missing.