Jacques Matanga, Yvon Lacroute, Pierre Gouton, Eric Bourillot. Optical characterization parameters by study and comparison of subwavelength patterns for color filtering and multispectral purpose. In Ralf Widenhorn, Antoine Dupret, editors, Sensors, Cameras, and Systems for Industrial and Scientific Applications XIV, Burlingame, California, USA, February 3-7, 2013. Volume 8659 of SPIE Proceedings, SPIE, 2013. [doi]
Abstract is missing.