DFT & ATPG: Together Again

Ben Mathew, Daniel G. Saab. DFT & ATPG: Together Again. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 262-271, IEEE Computer Society, 1995.

Authors

Ben Mathew

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Daniel G. Saab

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