Affect-Aware Machine Learning Models for Deception Detection

Leena Mathur. Affect-Aware Machine Learning Models for Deception Detection. In Thirty-Fifth AAAI Conference on Artificial Intelligence, AAAI 2021, Thirty-Third Conference on Innovative Applications of Artificial Intelligence, IAAI 2021, The Eleventh Symposium on Educational Advances in Artificial Intelligence, EAAI 2021, Virtual Event, February 2-9, 2021. pages 15968-15969, AAAI Press, 2021. [doi]

Abstract

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