Outage Probability Analysis of PLC with Channel Gain under Nakagami-m Additive Noise

Aashish Mathur, Manav R. Bhatnagar, Bijaya K. Panigrahi. Outage Probability Analysis of PLC with Channel Gain under Nakagami-m Additive Noise. In IEEE 82nd Vehicular Technology Conference, VTC Fall 2015, Boston, MA, USA, September 6-9, 2015. pages 1-7, IEEE, 2015. [doi]

Authors

Aashish Mathur

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Manav R. Bhatnagar

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Bijaya K. Panigrahi

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