Outage Probability Analysis of PLC with Channel Gain under Nakagami-m Additive Noise

Aashish Mathur, Manav R. Bhatnagar, Bijaya K. Panigrahi. Outage Probability Analysis of PLC with Channel Gain under Nakagami-m Additive Noise. In IEEE 82nd Vehicular Technology Conference, VTC Fall 2015, Boston, MA, USA, September 6-9, 2015. pages 1-7, IEEE, 2015. [doi]

@inproceedings{MathurBP15-1,
  title = {Outage Probability Analysis of PLC with Channel Gain under Nakagami-m Additive Noise},
  author = {Aashish Mathur and Manav R. Bhatnagar and Bijaya K. Panigrahi},
  year = {2015},
  doi = {10.1109/VTCFall.2015.7391062},
  url = {http://dx.doi.org/10.1109/VTCFall.2015.7391062},
  researchr = {https://researchr.org/publication/MathurBP15-1},
  cites = {0},
  citedby = {0},
  pages = {1-7},
  booktitle = {IEEE 82nd Vehicular Technology Conference, VTC Fall 2015, Boston, MA, USA, September 6-9, 2015},
  publisher = {IEEE},
  isbn = {978-1-4799-8091-8},
}