Arunesh Mathur, Mihir Kshirsagar, Jonathan R. Mayer. What Makes a Dark Pattern... Dark?: Design Attributes, Normative Considerations, and Measurement Methods. In Yoshifumi Kitamura, Aaron Quigley, Katherine Isbister, Takeo Igarashi, Pernille Bjørn, Steven Mark Drucker, editors, CHI '21: CHI Conference on Human Factors in Computing Systems, Virtual Event / Yokohama, Japan, May 8-13, 2021. ACM, 2021. [doi]
Abstract is missing.