Rivalino Matias Jr., Geycy Dyany Oliveira, Lucio Borges de Araujo. Operating system reliability from the quality of experience viewpoint: an exploratory study. In Sung Y. Shin, José Carlos Maldonado, editors, Proceedings of the 28th Annual ACM Symposium on Applied Computing, SAC '13, Coimbra, Portugal, March 18-22, 2013. pages 1644-1649, ACM, 2013. [doi]
Abstract is missing.