Correlation between localized strain and damage in shear-loaded Pb-free solders

M. A. Matin, J. G. A. Theeven, W. P. Vellinga, M. G. D. Geers. Correlation between localized strain and damage in shear-loaded Pb-free solders. Microelectronics Reliability, 47(8):1262-1272, 2007. [doi]

Abstract

Abstract is missing.