Constructing a Sequence Detecting Robustly Testable Path Delay Faults in Sequential Circuits

Anzhela Yu. Matrosova, Semen Chernyshov, O. Kh. Kim, Ekaterina Nikolaeva. Constructing a Sequence Detecting Robustly Testable Path Delay Faults in Sequential Circuits. Automation and Remote Control, 82(11):1949-1965, 2021. [doi]

Abstract

Abstract is missing.