Combinational part structure simplification of fully delay testable sequential circuit

Anzhela Matrosova, Eugeniy Mitrofanov, Elena Roumjantseva. Combinational part structure simplification of fully delay testable sequential circuit. In 2014 East-West Design & Test Symposium, EWDTS 2014, Kiev, Ukraine, September 26-29, 2014. pages 1-5, IEEE Computer Society, 2014. [doi]

Abstract

Abstract is missing.