Lars Mats. Selection Criteria for Automated TTCN Test Case Generation from SDL. In 2nd Workshop on Industrial-Strength Formal Specification Techniques (WIFT 98), October 20-23, 1998, Boca Raton, FL, USA. pages 10-11, IEEE Computer Society, 1998. [doi]
@inproceedings{Mats98,
title = {Selection Criteria for Automated TTCN Test Case Generation from SDL},
author = {Lars Mats},
year = {1998},
url = {http://csdl.computer.org/comp/proceedings/wift/1998/0081/00/00810010abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/Mats98},
cites = {0},
citedby = {0},
pages = {10-11},
booktitle = {2nd Workshop on Industrial-Strength Formal Specification Techniques (WIFT 98), October 20-23, 1998, Boca Raton, FL, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-0081-1},
}