Selection Criteria for Automated TTCN Test Case Generation from SDL

Lars Mats. Selection Criteria for Automated TTCN Test Case Generation from SDL. In 2nd Workshop on Industrial-Strength Formal Specification Techniques (WIFT 98), October 20-23, 1998, Boca Raton, FL, USA. pages 10-11, IEEE Computer Society, 1998. [doi]

Abstract

Abstract is missing.