V. Matsello, M. Schlesinger. Peculiarities of Structural Analysis of Image Contours Under Various Orders of Scanning. In Petra Perner, Patrick Shen-Pei Wang, Azriel Rosenfeld, editors, Advances in Structural and Syntactical Pattern Recognition, 6th International Workshop, SSPR 96, Leipzig, Germany, August 20-23, 1996, Proceedings. Volume 1121 of Lecture Notes in Computer Science, pages 260-268, Springer, 1996.
Abstract is missing.