Binary Radio Tomographic Imaging in Factory Environments Based on LOS/NLOS Identification

Takahiro Matsuda 0001, Yoshiaki Nishikawa, Eiji Takahashi, Takeo Onishi, Toshiki Takeuchi. Binary Radio Tomographic Imaging in Factory Environments Based on LOS/NLOS Identification. IEEE Access, 11:22418-22429, 2023. [doi]

Abstract

Abstract is missing.