Bayesian sequential face detection with automatic re-initialization

Atsushi Matsui, Simon Clippingdale, Takashi Matsumoto. Bayesian sequential face detection with automatic re-initialization. In 19th International Conference on Pattern Recognition (ICPR 2008), December 8-11, 2008, Tampa, Florida, USA. pages 1-4, IEEE, 2008. [doi]

Authors

Atsushi Matsui

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Simon Clippingdale

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Takashi Matsumoto

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