Few-Shot Learning Based on Metric Learning Using Class Augmentation - researchr publication

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Susumu Matsumi, Keiichi Yamada. Few-Shot Learning Based on Metric Learning Using Class Augmentation. In 25th International Conference on Pattern Recognition, ICPR 2020, Virtual Event / Milan, Italy, January 10-15, 2021. pages 196-201, IEEE, 2020. [doi]

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