Shinsuke Matsumoto, Yasutaka Kamei, Akito Monden, Ken-ichi Matsumoto. Comparison of Outlier Detection Methods in Fault-proneness Models. In Proceedings of the First International Symposium on Empirical Software Engineering and Measurement, ESEM 2007, September 20-21, 2007, Madrid, Spain. pages 461-463, IEEE Computer Society, 2007. [doi]
Abstract is missing.