Ryuta Matsuno, Keita Sakuma. A Robust Backward Compatibility Metric for Model Retraining. In Ingo Frommholz, Frank Hopfgartner, Mark Lee 0001, Michael Oakes 0001, Mounia Lalmas, Min Zhang 0006, Rodrygo L. T. Santos, editors, Proceedings of the 32nd ACM International Conference on Information and Knowledge Management, CIKM 2023, Birmingham, United Kingdom, October 21-25, 2023. pages 4190-4194, ACM, 2023. [doi]
Abstract is missing.