Simulation of state of the art EEPROM programming window closure during endurance degradation - researchr publication authors

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Franck Matteo, Roberto Simola, Franck Melul, Karine Coulié, Jérémy Postel-Pellerin, Arnaud Régnier. Simulation of state of the art EEPROM programming window closure during endurance degradation. In 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2021, Montpellier, France, June 28-30, 2021. pages 1-5, IEEE, 2021. [doi]

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