Francesco Mattia, Thuy Le Toan, Jong-Sen Lee, Dale L. Schuler. On the sensitivity of polarimetric coherence to small and large scale surface roughness. In 2003 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2003, Toulouse, France, July 21-15, 2003. pages 690-692, IEEE, 2003. [doi]
Abstract is missing.