External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

An approach to adjust the board-level drop test conditions to improve the correlation with product-level drop impact

Toni T. Mattila, Heikki Ruotoistenmäki, Jani Raami, Jussi Hokka, Manu Mäkelä, Esa Hussa, Markku Sillanpää, Ville Halkola. An approach to adjust the board-level drop test conditions to improve the correlation with product-level drop impact. Microelectronics Reliability, 54(4):785-795, 2014. [doi]

Abstract

Abstract is missing.

runs on