Sven Mattisson, Hans Hagberg, Pietro Andreani. Sensitivity Degradation in a Tri-Band GSM BiCMOS Direct-Conversion Receiver Caused by Transient Substrate Heating. J. Solid-State Circuits, 43(2):486-496, 2008. [doi]
@article{MattissonHA08,
title = {Sensitivity Degradation in a Tri-Band GSM BiCMOS Direct-Conversion Receiver Caused by Transient Substrate Heating},
author = {Sven Mattisson and Hans Hagberg and Pietro Andreani},
year = {2008},
doi = {10.1109/JSSC.2007.914306},
url = {https://doi.org/10.1109/JSSC.2007.914306},
researchr = {https://researchr.org/publication/MattissonHA08},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {43},
number = {2},
pages = {486-496},
}