Arnaldo Matute, Leonel Paredes-Madrid, Elkin I. Gutierrez Velasquez, Carlos A. Parra Vargas. Characterization of drift and hysteresis errors in force sensing resistors considering their piezocapacitive effect. In 2017 IEEE SENSORS, Glasgow, United Kingdom, October 29 - November 1, 2017. pages 1-3, IEEE, 2017. [doi]
@inproceedings{MatutePVV17,
title = {Characterization of drift and hysteresis errors in force sensing resistors considering their piezocapacitive effect},
author = {Arnaldo Matute and Leonel Paredes-Madrid and Elkin I. Gutierrez Velasquez and Carlos A. Parra Vargas},
year = {2017},
doi = {10.1109/ICSENS.2017.8234039},
url = {https://doi.org/10.1109/ICSENS.2017.8234039},
researchr = {https://researchr.org/publication/MatutePVV17},
cites = {0},
citedby = {0},
pages = {1-3},
booktitle = {2017 IEEE SENSORS, Glasgow, United Kingdom, October 29 - November 1, 2017},
publisher = {IEEE},
isbn = {978-1-5090-1012-7},
}