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Characterization of drift and hysteresis errors in force sensing resistors considering their piezocapacitive effect

Arnaldo Matute, Leonel Paredes-Madrid, Elkin I. Gutierrez Velasquez, Carlos A. Parra Vargas. Characterization of drift and hysteresis errors in force sensing resistors considering their piezocapacitive effect. In 2017 IEEE SENSORS, Glasgow, United Kingdom, October 29 - November 1, 2017. pages 1-3, IEEE, 2017. [doi]

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