Theresa Maudie, Alex Hardt, Rick Nielsen, Dennis Stanerson, Ron Bieschke, Mike Miller. MEMS Manufacturing Testing: An Accelerometer Case Study. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 843-849, IEEE Computer Society, 2003. [doi]
@inproceedings{MaudieHNSBM03,
title = {MEMS Manufacturing Testing: An Accelerometer Case Study},
author = {Theresa Maudie and Alex Hardt and Rick Nielsen and Dennis Stanerson and Ron Bieschke and Mike Miller},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20630843abs.htm},
tags = {case study, testing},
researchr = {https://researchr.org/publication/MaudieHNSBM03},
cites = {0},
citedby = {0},
pages = {843-849},
booktitle = {Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA},
publisher = {IEEE Computer Society},
isbn = {0-7803-8106-8},
}