3D model fitting for facial expression analysis under uncontrolled imaging conditions

Pierre Maurel, Aileen McGonigal, Renaud Keriven, Patrick Chauvel. 3D model fitting for facial expression analysis under uncontrolled imaging conditions. In 19th International Conference on Pattern Recognition (ICPR 2008), December 8-11, 2008, Tampa, Florida, USA. pages 1-4, IEEE, 2008. [doi]

Authors

Pierre Maurel

This author has not been identified. Look up 'Pierre Maurel' in Google

Aileen McGonigal

This author has not been identified. Look up 'Aileen McGonigal' in Google

Renaud Keriven

This author has not been identified. Look up 'Renaud Keriven' in Google

Patrick Chauvel

This author has not been identified. Look up 'Patrick Chauvel' in Google