Jacopo Mauro, Michael Nieke, Christoph Seidl, Ingrid Chieh Yu. Anomaly Detection and Explanation in Context-Aware Software Product Lines. In Maurice H. ter Beek, Walter Cazzola, Oscar Diaz, Marcello La Rosa, Roberto E. Lopez-Herrejon, Thomas Thüm, Javier Troya, Antonio Ruiz Cortés, David Benavides, editors, Proceedings of the 21st International Systems and Software Product Line Conference, SPLC 2017, Volume B, Sevilla, Spain, September 25-29, 2017. pages 18-21, ACM, 2017. [doi]
Abstract is missing.