Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard, Gilles Festes, Laurent Vachez. On using a SPICE-like TSTAC™ eFlash model for design and test. In Rolf Kraemer, Adam Pawlak, Andreas Steininger, Mario Schölzel, Jaan Raik, Heinrich Theodor Vierhaus, editors, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011. pages 359-364, IEEE, 2011. [doi]
@inproceedings{MaurouxVBDGPGFV11,
title = {On using a SPICE-like TSTAC™ eFlash model for design and test},
author = {Pierre-Didier Mauroux and Arnaud Virazel and Alberto Bosio and Luigi Dilillo and Patrick Girard and Serge Pravossoudovitch and Benoît Godard and Gilles Festes and Laurent Vachez},
year = {2011},
doi = {10.1109/DDECS.2011.5783111},
url = {http://dx.doi.org/10.1109/DDECS.2011.5783111},
researchr = {https://researchr.org/publication/MaurouxVBDGPGFV11},
cites = {0},
citedby = {0},
pages = {359-364},
booktitle = {14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011},
editor = {Rolf Kraemer and Adam Pawlak and Andreas Steininger and Mario Schölzel and Jaan Raik and Heinrich Theodor Vierhaus},
publisher = {IEEE},
isbn = {978-1-4244-9755-3},
}