Abhinav Maurya. Bayesian optimization for predicting rare internal failures in manufacturing processes. In James Joshi, George Karypis, Ling Liu, Xiaohua Hu, Ronay Ak, Yinglong Xia, Weijia Xu, Aki-Hiro Sato, Sudarsan Rachuri, Lyle H. Ungar, Philip S. Yu, Rama Govindaraju, Toyotaro Suzumura, editors, 2016 IEEE International Conference on Big Data, BigData 2016, Washington DC, USA, December 5-8, 2016. pages 2036-2045, IEEE, 2016. [doi]
Abstract is missing.