Solomon Max. Testing high speed high accuracy analog to digital converters embedded in systems on a chip. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 763-771, IEEE Computer Society, 1999.
@inproceedings{Max99,
title = {Testing high speed high accuracy analog to digital converters embedded in systems on a chip},
author = {Solomon Max},
year = {1999},
tags = {testing},
researchr = {https://researchr.org/publication/Max99},
cites = {0},
citedby = {0},
pages = {763-771},
booktitle = {Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999},
publisher = {IEEE Computer Society},
}