Mahta Mayahinia, Haneen G. Hezayyin, Mehdi B. Tahoori. Reliability analysis and mitigation for analog computation-in-memory: from technology to application. In 42nd IEEE VLSI Test Symposium, VTS 2024, Tempe, AZ, USA, April 22-24, 2024. pages 1-7, IEEE, 2024. [doi]
Abstract is missing.