Voltage Tuning for Reliable Computation in Emerging Resistive Memories

Mahta Mayahinia, Atousa Jafari, Mehdi B. Tahoori. Voltage Tuning for Reliable Computation in Emerging Resistive Memories. In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1-7, IEEE, 2022. [doi]

Authors

Mahta Mayahinia

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Atousa Jafari

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Mehdi B. Tahoori

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