A Versatile BIST Technique Combining Test Registers and Accumulators - researchr publication

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Frank Mayer, Albrecht P. Stroele. A Versatile BIST Technique Combining Test Registers and Accumulators. In 13th International Conference on VLSI Design (VLSI Design 2000), 4-7 January 2000, Calcutta, India. pages 412, IEEE Computer Society, 2000. [doi]

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