David Mayerich, Bruce H. McCormick, John Keyser. Noise and Artifact Removal in Knife-Edge Scanning Microscopy. In Proceedings of the 2007 IEEE International Symposium on Biomedical Imaging: From Nano to Macro, Washington, DC, USA, April 12-16, 2007. pages 556-559, IEEE, 2007. [doi]
@inproceedings{MayerichMK07,
title = {Noise and Artifact Removal in Knife-Edge Scanning Microscopy},
author = {David Mayerich and Bruce H. McCormick and John Keyser},
year = {2007},
doi = {10.1109/ISBI.2007.356912},
url = {http://dx.doi.org/10.1109/ISBI.2007.356912},
researchr = {https://researchr.org/publication/MayerichMK07},
cites = {0},
citedby = {0},
pages = {556-559},
booktitle = {Proceedings of the 2007 IEEE International Symposium on Biomedical Imaging: From Nano to Macro, Washington, DC, USA, April 12-16, 2007},
publisher = {IEEE},
}