David Mayerich, Bruce H. McCormick, John Keyser. Noise and Artifact Removal in Knife-Edge Scanning Microscopy. In Proceedings of the 2007 IEEE International Symposium on Biomedical Imaging: From Nano to Macro, Washington, DC, USA, April 12-16, 2007. pages 556-559, IEEE, 2007. [doi]
Abstract is missing.