Anneliese Amschler Andrews, Richard T. Mraz, Jeff Walls, Pete Ocken. Domain Based Testing: Increasing Test Case Reuse. In Proceedings 1994 IEEE International Conference on Computer Design: VLSI in Computer & Processors, ICCD 94, Cambridge, MA, USA, October 10-12, 1994. pages 484-491, IEEE Computer Society, 1994.
Abstract is missing.