B. M. Maziarz, V. K. Jain. Yield Estimates for the TESH Multicomputer Network. In 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings. pages 20-30, IEEE Computer Society, 2002. [doi]
@inproceedings{MaziarzJ02:0,
title = {Yield Estimates for the TESH Multicomputer Network},
author = {B. M. Maziarz and V. K. Jain},
year = {2002},
url = {http://www.computer.org/proceedings/dft/1831/18310020abs.htm},
researchr = {https://researchr.org/publication/MaziarzJ02%3A0},
cites = {0},
citedby = {0},
pages = {20-30},
booktitle = {17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-7695-1831-1},
}